Cell Sciences Imaging Facility
Electron Microscope
Background | System specifications | Manuals    

 

Background

The CSIF has purchased a new Hitachi S-3400N VP scanning electron microscope.


Unique features of the system include:

  • Patented Quad Bias and SE Bias Accelerator Plate Provide Superior Low Voltage Performance for Both High and Variable Pressure Vacuum Conditions
  • Large Analytical Chamber wtih 5 Axis, Computer Eucentric Stage
  • New, 5 Segment, Ultra Thin, Backscattered Electron Detector Capable of TV Rate Observation
  • Fully Automated with One Button Automatic "No Touch" Objective Aperture Alignment
  • Turbo Molecular Pump (TMP) Provides a Fast and Efficient 90 second Pump Down Time

System specifications:

Resolution 3.0nm High Vacuum Mode; 4.0nm Variable Pressure Mode
Detectors SE and BSE (solid state, TV rate observation)
Chamber Accommodates 10 inch specimen
Electron Gun Variable Quad Bias Circuitry with SE Accelerator Plate

Manual:

Manual for SEM-S3400N is available upon request at CSIF.